Process Yield and Capability Indices

Capability indices measure the performance of a process. Although process yield is the primary focus on the performance criteria, the " ( , ) p C u v indices combine process yield and process centering. With this compromise, there is no direct link between the process yield and these indices, but literature provides lower and upper bounds for the process yield. However errors in the proposed results limit the knowledge of these bounds to a few special cases. In this paper we give these bounds for any " ( , ) p C u v index, allowing the user to choose the index which best suits his needs. An application on high-tech paint is also presented.